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A UHV Diffraction Camera With Energy Filter for Convergent Beam RHEED and TED.

Published online by Cambridge University Press:  02 July 2020

U. Weierstall
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ85287
J.M. Zuo
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ85287
T. Kjørsvikf
Affiliation:
Department of Physics, Norwegian University of Science and Technology, 7034, Trondheim, Norway
J.C.H. Spence
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ85287
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A UHV diffraction camera has been built which can be used in either transmission or reflection mode. Fig. 1 shows a schematic view of the instrument. The optical axis of the instrument is vertical, with gun below and a downward-looking CCD camera on top. The pressure with gun operating is 1×10−10 Torr. An ion pump and oil-free turbo system is used. The electron gun is a fully bakeable custom UHV RHEED gun with LaB emitter and two magnetic lenses. This allows the beam to be focused to an area of about 1 micron on the surface of the sample. The gun works in the energy range of l-50keV. A double tilt stage, with sample exchange, has been built which allows azimuth rotation by 360° and tilt by ° 15°. The sample can be resistively heated on the stage up to 1300°C. The sample holder can also be used with 3mm diameter TEM grids for transmission diffraction. An external lens-coupled liquid-nitrogen cooled Princeton CCD camera with 1024×1024 pixels is used for image acquisition, viewing a transmission phosphor through a lead-glass window.

The energy filter consists of three spherical grids serving as a retarding field energy filter. The design is similar to that of Horio [1]. The first and last grids are grounded, while the center grid holds the retarding voltage. High voltage stability up to 10kV has been achieved with this filter. Fig. 2 shows an energy loss spectrum obtained.from the specular spot of the Si(111) surface. The spectrum was obtained from the measured integrated intensities by numerical differentiation.

Type
Electron Diffraction in the TEM
Copyright
Copyright © Microscopy Society of America

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References

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