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Transmission Microscopy: Beginning Automation
Published online by Cambridge University Press: 05 August 2019
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- Type
- The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]Williams, DB, Carter, CB (2009) Transmission Electron Microscopy: A Textbook for Materials Science, 2nd Ed. Springer, NY.Google Scholar
[2]Carter, CB, Williams, DB (2016) Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry, Chapter 2, 2nd Ed. Springer, NY.Google Scholar
[3]Tripathi, S, Janish, MT, Noor, N, Jungjohann, KL, Pete, D, Kotula, PG, Silva, H, Carter, CB (2018) presented at Fall MRS.Google Scholar
[5]Tripathi, S, Janish, MT, Mook, WM, Jungjohann, KL, Dongare, AM, Dobley, A, Carter, CB (2018) presented at Fall MRS.Google Scholar
[6]The authors thank their many collaborators, past and present, and in particular Joe Michael, Masashi Watanabe, Paul Kotula and Ian Anderson. They note that all 4 are past-Presidents of MAS and that Drs Anderson and Kotula are the 2017 and 2019 Presidents of MSA. CBC, DBW and PGK have all enjoyed interactions with Terry Mitchell, an MSA past-President and an acronym himself. CBC acknowledges CINT where he currently continues his research and advises on the application of TEM. CINT is the Center for Integrated Nanotechnology and is an Office of Science User Facility operated for the U.S. DOE by National Technology and Engineering Solutions of Sandia (NTES), LLC., which is a wholly owned subsidiary of Honeywell International, Inc., DBW is closely associated with CEMAS.Google Scholar
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