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Transmission Electron Microscopy Study on the Crystallization of Ion Beam Assisted Deposited CoFeB/MgO/CoFeB Magnetic Tunnel Junctions with Tantalum Capping Layer

Published online by Cambridge University Press:  08 April 2017

R Petrova ,
R Ferreira ,
S Cardoso ,
P Freitas ,
S McVitie  and
J Chapman
R Petrova
Affiliation:
International Iberian Nanotechnology Laboratory, Portugal
R Ferreira
Affiliation:
International Iberian Nanotechnology Laboratory, Portugal
S Cardoso
Affiliation:
INESC Microsystems and Nanotechnologies, Portugal
P Freitas
Affiliation:
IST, Portugal
S McVitie
Affiliation:
University of Glasgow, United Kingdom
J Chapman
Affiliation:
University of Glasgow, United Kingdom

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1860 - 1861
Copyright
Copyright © Microscopy Society of America 2011