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Towards Mapping Perovskite Oxide 3-D Structure Using Two-Dimensional Pixelated STEM Detector

Published online by Cambridge University Press:  25 July 2016

Magnus Nord ,
Andrew Ross ,
Ingrid Hallsteinsen ,
Thomas Tybell  and
Ian MacLaren
Magnus Nord
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow, United Kingdom
Andrew Ross
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow, United Kingdom
Ingrid Hallsteinsen
Affiliation:
Department of Electronics and Telecommunication, Norwegian University of Science and Technology, Trondheim, Norway
Thomas Tybell
Affiliation:
Department of Electronics and Telecommunication, Norwegian University of Science and Technology, Trondheim, Norway
Ian MacLaren
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow, United Kingdom

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 476 - 477
Copyright
© Microscopy Society of America 2016 

References

[1] Borisevich, A. Y., et al, Physical Review Letters 105 (2010). p. 087204.CrossRefGoogle Scholar
[2] Kim, Young-Min, et al, Advanced Materials 25 (2013). p. 2497.Google Scholar
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[4] Huang, F.-T, et al, Physical Review Letters 105 (2010). p. 125502.CrossRefGoogle Scholar
[5] Verbeeck, J. & Van Aert, S. Ultramicroscopy 101 (2004). p. 207.Google Scholar
[6] Dan, Zhou, et al, Ultramicroscopy 160 (2016). p. 110.Google Scholar
[7] The authors are indebted to the EPSRC for the funding of this work via the project “Fast Pixel Detectors: a paradigm shift in STEM imaging” (Grant reference EP/M009963/1).Google Scholar