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Three-Dimensional Analysis by Electron Diffraction Methods of Nanocrystalline Materials

  • Christoph Gammer (a1), Clemens Mangler (a1), Hans-Peter Karnthaler (a1) and Christian Rentenberger (a1)


To analyze nanocrystalline structures quantitatively in 3D, a novel method is presented based on electron diffraction. It allows determination of the average size and morphology of the coherently scattering domains (CSD) in a straightforward way without the need to prepare multiple sections. The method is applicable to all kinds of bulk nanocrystalline materials. As an example, the average size of the CSD in nanocrystalline FeAl made by severe plastic deformation is determined in 3D. Assuming ellipsoidal CSD, it is deduced that the CSD have a width of 19 ± 2 nm, a length of 18 ± 1 nm, and a height of 10 ± 1 nm.


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Three-Dimensional Analysis by Electron Diffraction Methods of Nanocrystalline Materials

  • Christoph Gammer (a1), Clemens Mangler (a1), Hans-Peter Karnthaler (a1) and Christian Rentenberger (a1)


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