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Thickness and Stacking Sequence Determination of Exfoliated Dichalchogenides Using Scanning Transmission Electron Microscopy
Published online by Cambridge University Press: 25 July 2016
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1456 - 1457
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- © Microscopy Society of America 2016
References
References:
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Tsen, A. W., Hovden, R., et al.,
Proc. Natl. Acad. Sci. U.S.A
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[2] We thank Yu Liu, Wenjian J. Lu, and Yuping Sun for providing the TaS2 crystal. This work was supported by the Packard Foundation and made use of the Cornell Center for Materials Research Facilities which are supported through the NSF MRSEC program (DMR-1120296).Google Scholar
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