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Texture Determination of Ceramic Materials by EBSD

Published online by Cambridge University Press:  02 July 2020

F. Cosandey ,
P. Markondeya Raj  and
W. R. Cannon
F. Cosandey
Affiliation:
Department of Ceramic and Materials Engineering, Rutgers University, Piscataway, NJ08854-8065
P. Markondeya Raj
Affiliation:
Department of Ceramic and Materials Engineering, Rutgers University, Piscataway, NJ08854-8065
W. R. Cannon
Affiliation:
Department of Ceramic and Materials Engineering, Rutgers University, Piscataway, NJ08854-8065
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Extract

Texture determination of ceramic materials is important in ceramic processing since it will ultimately govern the resulting material properties. For instance, recent results have indicated that preferred particle orientation leads to anisotropic shrinkage of tape cast ceramics. In this work, we report results on the effect of pressing as well as shearing during tape casting followed by sintering on particle orientation and texture development in ceramic materials. Oxides with different particle shape anisotropy and crystal structures have been investigated including tetragonal rutile titania (TiO2) and hexagonal alumina (A12O3).

Ceramic samples were processed by either pressing or by tape casting of a high ceramic particle loading aqueous suspensions. The samples were then pyrolized at 425°C followed by sintering for one hour at 1200 and 1500°C for TiO2 and A12O3 respectively. High spatial resolution Electron Backscatter Diffraction (EBSD) (OPAL-Oxford) in a field emission SEM (LEO-982) has been used for texture analysis and for crystallographic orientation determination of particles. Between, 3000 to 5000 measurements per sample were recorded automatically to develop an orientation map.

Type
Electron diffraction in the SEM: automated EBSP and its application
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 224 - 225
Copyright
Copyright © Microscopy Society of America

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References

1. Watanabe, H., Kimura, T. and Yamaguchi, T., J. Am. Ceram. Soc, 72, [2] 289, (1989).CrossRefGoogle Scholar
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3. Markondeya Raj, P., Dunn, S. M., and Cannon, W. R., J. Comp.-Assist Microscopy, (1999) In PressGoogle Scholar