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Temperature Measurement by a Nanoscale Electron Probe using Energy Gain and Loss Spectroscopy

Published online by Cambridge University Press:  01 August 2018

Juan Carlos Idrobo ,
Andrew R. Lupini ,
Tianli Feng ,
Raymond R. Unocic ,
Franklin S. Walden ,
Daniel S. Gardiner ,
Tracy C. Lovejoy ,
Niklas Dellby ,
Sokrates T. Pantelides  and
Ondrej L. Krivanek
Juan Carlos Idrobo
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Andrew R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Tianli Feng
Affiliation:
Department of Physics and Astronomy and Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA
Raymond R. Unocic
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Franklin S. Walden
Affiliation:
Protochips Company, 3800 Gateway Centre Blvd, Suite 306, Morrisville, NC, USA
Daniel S. Gardiner
Affiliation:
Protochips Company, 3800 Gateway Centre Blvd, Suite 306, Morrisville, NC, USA
Tracy C. Lovejoy
Affiliation:
Nion Company, 11511 NE 118th St, Kirkland, WA, USA
Niklas Dellby
Affiliation:
Nion Company, 11511 NE 118th St, Kirkland, WA, USA
Sokrates T. Pantelides
Affiliation:
Department of Physics and Astronomy and Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA
Ondrej L. Krivanek
Affiliation:
Nion Company, 11511 NE 118th St, Kirkland, WA, USA
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Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 98 - 99
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© Microscopy Society of America 2018 

References

[1] Pop, E, etal Proc. IEEE 94 (2006), p. 1587.Google Scholar
[2] Mecklenburg, M, et al, Science 347 2015) p 629.CrossRefGoogle Scholar
[3] Boersch, H, et al, Phys. Rev. Lett. 17 1966) p 379.CrossRefGoogle Scholar
[4] Howie, A Adv. Inst. Phys. Conf Ser. 161 1999) p 311.Google Scholar
[5] Garcia de Abajo, FJ Kociak, M. New J. Phys. 10 2008) p 073035.CrossRefGoogle Scholar
[6] Idrobo, JC, et al Phys. Rev. Lett. (2016), in press.Google Scholar
[7] Squires, GL Thermal Neutron Scattering, 3rd edn Cambridge University Press 2012.Google Scholar
[8] Research supported by ORNL's Center for Nanophase Materials Sciences, which is a U.S. Department of Energy Office of Science User Facility (J.C.I. and R.R.U.), and by the Materials Sciences and Engineering Division Office of Basic Energy Sciences, U.S. Department of Energy (A.R.L.). This research used resources of the National Energy Research Scientific Computing Center, which is supported by the Office of Science of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231, and instrumentation within ORNL's Materials Characterization Core provided by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. This work used the Extreme Science and Engineering Discovery Environment (XSEDE). Theoretical work at Vanderbilt University was supported by DOE Award No. DE-FG02-09ER46554 and by the McMinn Endowment (T.L.F. and S.T.P.).Google Scholar

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