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TEM Sample Preparation of Patterned Quantum Dots

Published online by Cambridge University Press:  05 August 2019

H Wang ,
V Srot ,
B Fenk ,
G Laskin ,
J Mannhart  and
PA van Aken
H Wang*
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
V Srot
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
B Fenk
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
G Laskin
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
J Mannhart
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
PA van Aken
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany.
*
*Corresponding author: hgwang@fkf.mpg.de

Abstract

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Type
Microscopy and Microanalysis for Real-World Problem Solving
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 790 - 791
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Boschker, H et al. , Annu. Rev. Conden. Ma. P. 8 (2017), p. 145.Google Scholar
[2]Alivisatos, AP, Science 271 (1996), p. 933.Google Scholar
[3]Senellart, P et al. , Nat. Nanotech. 12 (2017), p. 1026.Google Scholar
[4]Laskin, G et al. , Nano Lett. (2019), in press.Google Scholar
[5]The research leading to these results has received financial support from the China Scholarship Council (No. 201504910813) and the Max Planck Society. This project has received funding from the European Union's Horizon 2020 research and innovation programme under grant agreement No. 823717 – ESTEEM3.Google Scholar