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TEM Imaging and Electron Diffraction of Vertically Stacked Graphene/h-BN with Fine Control of Twist Angle

Published online by Cambridge University Press:  05 August 2019

Sol Lee ,
Yangjin Lee ,
Jun-Yeong Yoon  and
Kwanpyo Kim
Sol Lee
Affiliation:
Department of Physics, Yonsei University, Seoul, Republic of Korea. Center for Nanomedicine, Institute of Basic Science (IBS), Seoul, Republic of Korea.
Yangjin Lee
Affiliation:
Department of Physics, Yonsei University, Seoul, Republic of Korea. Center for Nanomedicine, Institute of Basic Science (IBS), Seoul, Republic of Korea.
Jun-Yeong Yoon
Affiliation:
Department of Physics, Yonsei University, Seoul, Republic of Korea. Center for Nanomedicine, Institute of Basic Science (IBS), Seoul, Republic of Korea.
Kwanpyo Kim*
Affiliation:
Department of Physics, Yonsei University, Seoul, Republic of Korea. Center for Nanomedicine, Institute of Basic Science (IBS), Seoul, Republic of Korea.
*
*Corresponding author: kpkim@yonsei.ac.kr

Abstract

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Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2114 - 2115
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Novoselov, K. S. et al. , Science 353 (2016), aac9439.Google Scholar
[2]Lee, W. C. et al. Nat. Nanotechnol. 10 (2015), 423-428.Google Scholar
[3]Jang, J. et al. , Nano Lett. 18 (2018), 6214-6221.Google Scholar
[4]The authors acknowledge funding from the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2017R1A5A1014862) and the Institute for Basic Science (IBS-R026-D1).Google Scholar