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TEM Imaging and Electron Diffraction of Vertically Stacked Graphene/h-BN with Fine Control of Twist Angle

Published online by Cambridge University Press:  05 August 2019


Sol Lee
Affiliation:
Department of Physics, Yonsei University, Seoul, Republic of Korea. Center for Nanomedicine, Institute of Basic Science (IBS), Seoul, Republic of Korea.
Yangjin Lee
Affiliation:
Department of Physics, Yonsei University, Seoul, Republic of Korea. Center for Nanomedicine, Institute of Basic Science (IBS), Seoul, Republic of Korea.
Jun-Yeong Yoon
Affiliation:
Department of Physics, Yonsei University, Seoul, Republic of Korea. Center for Nanomedicine, Institute of Basic Science (IBS), Seoul, Republic of Korea.
Kwanpyo Kim
Affiliation:
Department of Physics, Yonsei University, Seoul, Republic of Korea. Center for Nanomedicine, Institute of Basic Science (IBS), Seoul, Republic of Korea.
Corresponding
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Abstract

Image of the first page of this article

Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Novoselov, K. S. et al. , Science 353 (2016), aac9439.CrossRefGoogle Scholar
[2]Lee, W. C. et al. Nat. Nanotechnol. 10 (2015), 423-428.CrossRefGoogle Scholar
[3]Jang, J. et al. , Nano Lett. 18 (2018), 6214-6221.CrossRefGoogle Scholar
[4]The authors acknowledge funding from the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2017R1A5A1014862) and the Institute for Basic Science (IBS-R026-D1).Google Scholar

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TEM Imaging and Electron Diffraction of Vertically Stacked Graphene/h-BN with Fine Control of Twist Angle
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