Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-06-23T02:33:25.402Z Has data issue: false hasContentIssue false
  • English
  • Français

TEM Characterization of a Mg2Si0.5Sn0.5 Solid Solution for High-Performance Thermoelectrics

Published online by Cambridge University Press:  23 September 2015

Minghui Song ,
Ji-Wei Liu ,
Masaki Takeguchi ,
Naohito Tsujii  and
Yukihiro Isoda
Minghui Song
Affiliation:
Transmission Electron Microscopy Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 3050047 Japan.
Ji-Wei Liu
Affiliation:
Transmission Electron Microscopy Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 3050047 Japan.
Masaki Takeguchi
Affiliation:
Transmission Electron Microscopy Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 3050047 Japan.
Naohito Tsujii
Affiliation:
Quantum Beam Unit, NIMS, 1-2-1 Sengen, Tsukuba, Ibaraki 3050047 Japan.
Yukihiro Isoda
Affiliation:
Battery Materials Unit, NIMS, 1-2-1 Sengen, Tsukuba, Ibaraki 3050047 Japan.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1809 - 1810
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Liu, W., et al, Chem. Mater. 23 (2011). p 5256.Google Scholar
[2] Zaitsev, V. K., et al, Phys. Rev. B 74 (2006). p 045207.Google Scholar
[3] Liu, J. W., et al, J. Electronic Mater 44 (2015). p 407.Google Scholar
[4] Thanks to Mitsuaki Nishio in NIMS for his help and discussion on the EPMA analysis.Google Scholar