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TEM Based High Resolution Electron Diffraction Techniques for Three-dimensional Nanostructure Determination

  • Jian-Min Zuo (a1) (a2), Yifei Meng (a1) (a2), Piyush Vivek Deshpande (a1) (a2), Yang Hu (a1) (a2), Kyou-Hyun Kim (a1) (a2), Hui Xing (a1) (a2) (a3), Peng Zhang (a4) and Haifeng Wang (a4)...
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References

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[1] Cowley, J.M. "Electron Diffraction Techniques." 1993: International Union of Crystallography..
[2] Spence, J.C.H. & Zuo, J.M., “Electron microdiffraction”. (1992) Plenum Press.
[3] Zuo, J.M., et al, Science (2003) 300(5624): p. 14191421.
[4] Zuo, J.M., et al., Microscopy Research and Technique (2004) 64(5-6): p. 347355.
[5] Rauch, E.F., et al, Zeitschrift Fur Kristallographie (2010) 225(2-3): p. 103109.
[6] Alloyeau, D., et al, Ultramicroscopy (2008) 108(7): p. 656662.
[7] Ganesh, K., et al, “Microscopy and Microanalysis” (2010). 16(SupplementS2) (p. 17281729.
[8] Liu, H.H., et al, Science (2011) 332(6031): p. 833834.
[9] Tao, J., et al, Physical Review Letters (2009) 103(9.
[10] The work reported here is supported by DOE BES under contract DEFG02-01ER45923 and a grant from Western Digital..

TEM Based High Resolution Electron Diffraction Techniques for Three-dimensional Nanostructure Determination

  • Jian-Min Zuo (a1) (a2), Yifei Meng (a1) (a2), Piyush Vivek Deshpande (a1) (a2), Yang Hu (a1) (a2), Kyou-Hyun Kim (a1) (a2), Hui Xing (a1) (a2) (a3), Peng Zhang (a4) and Haifeng Wang (a4)...

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