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TEM and SEM characterizations of Aligned ZnO Nanorods on Si Substrates

  • F Liu (a1), W Jäger (a2), X Zhang (a3), Y Zeng (a3), L Zhu (a3) and Z Ye (a3)...

Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

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