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Synchrotron-based X-ray Fluorescence Microscopy as a Complementary Tool to Light Microscopy/Electron Microscopy for Multi-scale and Multi-modality Analysis

Published online by Cambridge University Press:  10 August 2018

S. Chen*
Affiliation:
X-ray Science Division, Argonne National Laboratory, IL, USA.
T. Ducic
Affiliation:
CELLS - ALBA, Barcelona, Spain.
Q. Jin
Affiliation:
Dep. of Physics and Astronomy, Northwestern University, IL, USA.
X. Wu
Affiliation:
X-ray Science Division, Argonne National Laboratory, IL, USA. College of Materials Science and Engineering, Beijing University of Technology, Beijing, China.
N. Zaluzec
Affiliation:
Photon Sciences Division, Argonne National Laboratory, IL, USA.
B. Lai
Affiliation:
X-ray Science Division, Argonne National Laboratory, IL, USA.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

References:

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[2] Ducic, T., et al, ACS Chem. Neurosci. 2015 6(10), 17691779.Google Scholar
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[4] Daoust, A., et al, Proc. 26th ISMRM Annual Meeting 2018) in press.Google Scholar
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[7] This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility, and the Center for Nanoscale Materials a U.S. DOE Office of Science, Office of Basic Energy Sciences by Argonne National Laboratory under Contract No. DE-AC02-06CH11357, as well as support from Laboratory Directed Research and Development (LDRD) funding at Argonne National Laboratory under Contract No. 2017-153-N0. The work on Al alloys is partially supported by the National Natural Science Foundation of China, under Contract No. 51701006.Google Scholar