Hostname: page-component-848d4c4894-r5zm4 Total loading time: 0 Render date: 2024-06-19T17:04:12.182Z Has data issue: false hasContentIssue false
  • English
  • Français

Surface Preparation for Characterizing Microstructure on Transuranic Oxides by Electron Backscatter Spectroscopy and Ion Beam Imaging

Published online by Cambridge University Press:  23 November 2012

P.A. Papin ,
C. Chris ,
R.T. Forsyth ,
E.P. Luther  and
C.T. Necker
P.A. Papin
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM
C. Chris
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM
R.T. Forsyth
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM
E.P. Luther
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM
C.T. Necker
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 708 - 709
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)