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Super-Resolution Electron Microscopy using Multi-Resolution Data Fusion

Published online by Cambridge University Press:  04 August 2017

Charles A. Bouman
Charles A. Bouman*
Affiliation:
Showalter Professor, Electrical and Computer Engineering, Purdue University, West Lafayette, IN.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 86 - 87
Copyright
© Microscopy Society of America 2017 

References

[1] Williams, D.B & Carter, C.B. Transmission electron microscopy. Springer 1996). pp. 3.Google Scholar
[2] Guillemot, C. & Le Meur, O. Signal Processing Magazine, IEEE 31(1 2014). pp. 127.Google Scholar
[3] Park, S.C., Park, M.K. & Kang, M.G. Signal Processing Magazine, IEEE 20(3 2003). pp. 21.CrossRefGoogle Scholar
[4] Sreehari, S., Venkatakrishnan, S.V., Wohlberg, B., Buzzard, G.T., Drummy, L.F., Simmons, J.P. & Bouman, C.A. Transactions on Computational Imaging. IEEE 2(4 2016). pp. 408.Google Scholar
[5] Sreehari, S., Venkatakrishnan, S.V., Bouman, K.L., Simmons, J.P., Drummy, L.F. & Bouman, C.A. arXiv:1612.00874 2016.Google Scholar
[6] This work was supported by AFOSR/MURI grant #FA9550-12-1-0458, by UES Inc.Google Scholar