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Sub-Ångstrom EDX Mapping Enabled by a High-brightness Cold Field Emission Source

Published online by Cambridge University Press:  30 July 2020

Berit Goodge
Affiliation:
Cornell University, Ithaca, New York, United States
Anna Carlsson
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Maarten Bischoff
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Ali Mohammadi-Gheidari
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Gamal Fallag
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Greg Schwind
Affiliation:
BeamTech, Hillsboro, Oregon, United States
Christian Maunders
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
David Muller
Affiliation:
Cornell University, Ithaca, New York, United States
Lena Kourkoutis
Affiliation:
Cornell University, Ithaca, New York, United States
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Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Copyright
Copyright © Microscopy Society of America 2020

References

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Smeets, , et al. Microscopy and Microanalysis 25 S2 (2019), p. 17221723.10.1017/S1431927619009346CrossRefGoogle Scholar
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Supported by PARADIM, an NSF-MIP (DMR-1539918), with additional support by NSF (DMR-1429155, DMR-1719875). DyScO3 sample provided by D. G. Schlom (Cornell University).Google Scholar
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