Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-06-20T20:29:42.913Z Has data issue: false hasContentIssue false
  • English
  • Français

Sub-Å STEM Resolution From 30-300kV

Published online by Cambridge University Press:  01 August 2018

Maarten Bischoff ,
Marcel Niestadt ,
Veli Altin ,
Alexander Henstra ,
Peter Tiemeijer ,
Bert Freitag ,
Christian Maunders ,
Peter Hartel  and
Eric Van Cappellen
Maarten Bischoff
Affiliation:
Thermo Fisher Scientific, Acht, The Netherlands.
Marcel Niestadt
Affiliation:
Thermo Fisher Scientific, Acht, The Netherlands.
Veli Altin
Affiliation:
Thermo Fisher Scientific, Acht, The Netherlands.
Alexander Henstra
Affiliation:
Thermo Fisher Scientific, Acht, The Netherlands.
Peter Tiemeijer
Affiliation:
Thermo Fisher Scientific, Acht, The Netherlands.
Bert Freitag
Affiliation:
Thermo Fisher Scientific, Acht, The Netherlands.
Christian Maunders
Affiliation:
Thermo Fisher Scientific, Acht, The Netherlands.
Peter Hartel
Affiliation:
Corrected Electron Optical Systems GmbH, Heidelberg, Germany.
Eric Van Cappellen
Affiliation:
Thermo Fisher Scientific, Hillsboro, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1134 - 1135
Copyright
© Microscopy Society of America 2018