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Study of Correlative Evaporation and Ion Dissociation in Atom Probe Data

Published online by Cambridge University Press:  30 July 2020

Yimeng Chen
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States
Brian Geiser
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States
Ed Oltman
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States
Katherine Rice
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States
Robert Ulfig
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States
Ty Prosa
Affiliation:
CAMECA Instruments, Inc, Madison, Wisconsin, United States

Abstract

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Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Copyright
Copyright © Microscopy Society of America 2020

References

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