Hostname: page-component-848d4c4894-2pzkn Total loading time: 0 Render date: 2024-05-26T13:29:23.204Z Has data issue: false hasContentIssue false

Structure and Chemistry of Oxide Surface Reconstructions in III-Nitrides Observed using STEM EELS

Published online by Cambridge University Press:  04 August 2017

J. Houston Dycus
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh NC, 27695-7907
Kelsey J. Mirrielees
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh NC, 27695-7907
Everett D. Grimley
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh NC, 27695-7907
Rohan Dhall
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh NC, 27695-7907
Ronny Kirste
Affiliation:
Adroit Materials, Inc., 2054 Kildaire Farm Rd., Suite 205, Cary, North Carolina 27518, USA
Seiji Mita
Affiliation:
Adroit Materials, Inc., 2054 Kildaire Farm Rd., Suite 205, Cary, North Carolina 27518, USA
Zlatko Sitar
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh NC, 27695-7907
Ramon Collazo
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh NC, 27695-7907
Douglas L. Irving
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh NC, 27695-7907
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh NC, 27695-7907

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Zhu, G. Z., Radtke, G. & Botton, G. A. Nature 490 2012). p. 384387.CrossRefGoogle Scholar
[2] Xu, W., et. al, Applied Physics Letters 109(20 2016). p. 201601.Google Scholar
[3] Dong, Y., Feenstra, R. M. & Northrup, J. E. Journal of Vacuum Science and Technology 24(4 2006). p. 20802086.Google Scholar
[4] Miao, M. S., Weber, J. R. & Van de Walle, C. G. Journal of Applied Physics 107 2010). p. 123.Google Scholar
[5] Dycus, J. H., et al, Microscopy and Microanalysis 21 2015). p. 946952.Google Scholar
[6] Sang, X. & LeBeau, J. M. Ultramicroscopy 138 2014). p. 2835.Google Scholar
[7] JHD, EDG and JML acknowledge the Analytical Instrumentation Facility (AIF) at North Caroli State University. JHD and EDG acknowledge support by the National Science Foundation Graduate Research Fellowship (Grant DGE-1252376). Research was supported by the Air Force Office of Scientific Research (Grant No. FA9550-14-1-0182).Google Scholar