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Structural Characterization of Beam Sensitive Pharmaceutical Compounds Using 3D Electron Diffraction-Micro-ED at Low Dose with Pixelated Detectors

Published online by Cambridge University Press:  30 July 2020

Partha Pratim Das
Affiliation:
NanoMEGAS SPRL, Brussels, Brussels Hoofdstedelijk Gewest, Belgium
Alejandro Gómez Pérez
Affiliation:
NanoMEGAS SPRL, Brussels, Brabant Wallon, Belgium
Athanassios S. Galanis
Affiliation:
NanoMEGAS SPRL, Brussels, Brussels Hoofdstedelijk Gewest, Belgium
Stavros Nicolopoulos
Affiliation:
NanoMEGAS SPRL, Brussels, Brussels Hoofdstedelijk Gewest, Belgium

Abstract

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Type
Crystallography at the Nanoscale and MicroED with Electrons and X-rays
Copyright
Copyright © Microscopy Society of America 2020

References

Gemmi, M., Mugnaioli, E., Gorelik, T. E., Kolb, U., Palatinus, L., Boullay, P., Hovmöller, S., Abrahams, J. P.. ACS Central Science 2019, 5(8), 13151329.10.1021/acscentsci.9b00394CrossRefGoogle Scholar
van Genderen, E., Clabbers, M.T.B., Pratim Das, P., Nederlof, I., Stewart, A., Portillo, Q., Nicolopoulos, S., Abrahams, J.P., Acta Crystallogr. A 2016, 72, 236242.10.1107/S2053273315022500CrossRefGoogle Scholar
Das, P. P., Mugnaioli, E., Nicolopoulos, S., Tossi, C., Gemmi, M., Galanis, A., Borodi, G., Pop, M. M., Org. Process Res. Dev. 2018, 22, 13651372.10.1021/acs.oprd.8b00149CrossRefGoogle Scholar