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STEM-EELS Imaging of Resonant Modes in Dielectric Silicon Nanostructures

Published online by Cambridge University Press:  05 August 2019

Valentin Flauraud  and
Duncan T.L. Alexander
Valentin Flauraud
Affiliation:
Electron Spectrometry and Microscopy Laboratory (LSME), Institute of Physics (IPHYS), Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland.
Duncan T.L. Alexander*
Affiliation:
Electron Spectrometry and Microscopy Laboratory (LSME), Institute of Physics (IPHYS), Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland.
*
*Corresponding author: duncan.alexander@epfl.ch

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 634 - 635
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]García de Abajo, FJ, Rev. Mod. Phys. 82 (2010), p. 209.Google Scholar
[2]Decker, M. and Staube, I., J. Opt. 18 (2016), 103001.Google Scholar
[3]van de Groep, J and Polman, A, Opt. Express 21 (2013), 26285.Google Scholar
[4]Habteyes, TF et al. , ACS Photonics 1 (2014), p. 794.Google Scholar
[5]Coenen, T, van de Groep, J and Polman, A, ACS Nano 7 (2013), p. 1689.Google Scholar
[6]van de Groep, J et al. , Optica 3 (2016), 93.Google Scholar
[7]Staude, I et al. , ACS Nano 7 (2013), p. 7824.Google Scholar
[8]We thank the CIME and CMI at EPFL for access to their facilities.Google Scholar