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STEM Strain Measurement From a Stream of Diffraction Patterns Recorded on a Pixel-Free Delay-Line Detector

Published online by Cambridge University Press:  25 July 2016

Knut Müller-Caspary ,
Andreas Oelsner  and
Pavel Potapov
Knut Müller-Caspary
Affiliation:
IFP, Universitat Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany
Andreas Oelsner
Affiliation:
Surface Concept GmbH, Am Sägewerk 23a, 55124 Mainz, Germany
Pavel Potapov
Affiliation:
GLOBALFOUNDRIES Dresden Module 1, Wilschdorfer Landstr. 101, 01109 Dresden, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 520 - 521
Copyright
© Microscopy Society of America 2016 

References

[1] Müller, K., et al., Nature Communications 5 (2014) 5653.Google Scholar
[2] Müller-Caspary, K., Oelsner, A. & Potapov, P. Applied Physics Letters 107 (2015) 072110.CrossRefGoogle Scholar
[3] Müller, K., Rosenauer, A., et al., Microscopy and Microanalysis 18 (2012) 995.Google Scholar
[4] Funding: Deutsche Forschungsgemeinschaft (DFG) under contract MU3660/1-1.Google Scholar