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Microscopy and Microanalysis Microscopy and Microanalysis

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STEM Phase Imaging by Annular Pixel Array Detector (A-PAD) Combined with Quasi-Bessel Beam

Published online by Cambridge University Press:  25 July 2016

Tadahiro Kawasaki ,
Takafumi Ishida ,
Tetsuji Kodama ,
Takayoshi Tanji  and
Takashi Ikuta
Tadahiro Kawasaki
Affiliation:
Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya, Japan Institute of Materials and Systems for Sustainability, Nagoya University, Nagoya, Japan
Takafumi Ishida
Affiliation:
Institute of Materials and Systems for Sustainability, Nagoya University, Nagoya, Japan Global Research Center for Environment & Energy based on Nanomaterials Science, Tsukuba, Japan
Tetsuji Kodama
Affiliation:
Graduate School of Science & Technology, Meijo University, Nagoya, Japan
Takayoshi Tanji
Affiliation:
Institute of Materials and Systems for Sustainability, Nagoya University, Nagoya, Japan Global Research Center for Environment & Energy based on Nanomaterials Science, Tsukuba, Japan
Takashi Ikuta
Affiliation:
Faculty of Engineering, Osaka Electro-Communication University, Neyagawa, Japan

Abstract

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Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 480 - 481
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Yang, H., et al., Ultramicrosc 151 (2015) 232.CrossRefGoogle Scholar
[2] Taya, M., et al., Rev. Sci. Inst 78 (2007) 083705.CrossRefGoogle Scholar
[3] Jumphry, M. J., et al., Nat. Comm 3 (2012) 730.CrossRefGoogle Scholar
[4] Kawasaki, T., et al., Ultramicrosc 110 (2010) 1332.CrossRefGoogle Scholar
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