Hostname: page-component-848d4c4894-4hhp2 Total loading time: 0 Render date: 2024-05-13T00:05:17.551Z Has data issue: false hasContentIssue false
  • English
  • Français

Spot Measurement Tool for Diffraction Pattern Analysis

Published online by Cambridge University Press:  02 July 2020

David S. Bright ,
Alline F. Myers ,
Shirley Turner  and
Eric B. Steel
David S. Bright
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20899
Alline F. Myers
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20899
Shirley Turner
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20899
Eric B. Steel
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20899
Get access

Extract

Accurate characterization of electron diffraction patterns can be tedious, which encourages development of computer assisted tools and methods. We developed a spot measurement tool to characterize rapidly arrays of diffraction spots that are characteristic of a single crystal, and to measure precisely the d-spacing values for individual spots. The spot tool determines these vectors for averaged measurements from many spots in a digital image of the diffraction pattern. Previously we developed automated methods for spot pattern analysis. Why make an operator-assisted tool? This tool is faster than either our automated or entirely manual methods, and it allows assessment of the quality of the data at the beginning of the analysis.

It is easy to see regular patterns of spots in a zone axis diffraction pattern (Fig. 1.1). An operator guides the initial calculations by adjusting an array of circles to approximately cover the spots in the pattern to be analyzed.

Type
Applied Image Processing: What it Can do for Digital Imaging
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 60 - 61
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Zou, X, et. al., Ultramicroscopy 49 (1993)147.CrossRefGoogle Scholar
2.Dufner, D.C., Microbeam Analysis (1996) 594.CrossRefGoogle Scholar
3. The tool is integrated into MacLispix, a freeware Macintosh image processing program. MacLisplix also has tools for measuring diameters of rings, and searching for compounds in the ICDD (International Centre for Diffraction Data) powder diffraction file. (Certain commercial equipment, instruments, or materials are identified in tnis paper to specify the experimental procedure adequately. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the materials or equipment identified are necessarily the best available for the purpose.)Google Scholar
4.Bright, D.S. and Steel, E.B., Microbeam Analysis (1985) 163.Google Scholar
5.Bright, D.S. and Steel, E.B., J. Microscopy 150 (1988) 167.CrossRefGoogle Scholar
6. The titanium silicide film was provided by H.I. Liu and J.A. Burns of MIT Lincoln Labs.Google Scholar