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Sparsity and Noise Effects on the Reconstruction of Subsampled Scanning Transmission Electron Microscopy Data

Published online by Cambridge University Press:  22 July 2022

Eduardo Ortega  and
Niels de Jonge
Eduardo Ortega
Affiliation:
INM - Leibniz Institute for New Materials, Saarbrücken, Germany
Niels de Jonge
Affiliation:
INM - Leibniz Institute for New Materials, Saarbrücken, Germany Department of Physics, Saarland University, Saarbrücken, Germany

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2136 - 2137
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Copyright
Copyright © Microscopy Society of America 2022

References

Mehdi, B.L. et al. , Appl. Phys. Lett. 115 (2019), p. 063102. doi: 10.1063/1.5096595CrossRefGoogle Scholar
Ortega, E. et al. , Sci. Rep. 11 (2021), p. 22722. doi: 10.1038/s41598-021-02052-1Google Scholar
Schwartz, J et al. , Microsc. Microanal. 25 (2019), p. 705. doi:10.1017/S1431927619000254Google Scholar
D Nicholls et al., Ultramicroscopy 233 (2022), p. 113451. doi: 10.1016/j.ultramic.2021.113451Google Scholar
The authors thank E. Arzt for his support through INM. The research was supported by the German Research Foundation.Google Scholar