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The sources of contamination of TEM samples and the means for its reduction

  • C. Soong (a1), D. Hoyle (a1), M. Malac (a2) and R. Egerton (a2)

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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The sources of contamination of TEM samples and the means for its reduction

  • C. Soong (a1), D. Hoyle (a1), M. Malac (a2) and R. Egerton (a2)

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