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Soft X-ray Scanning Transmission Microscopy Studies of Radiation Damage by Electron, Ion and X-ray Beams

Published online by Cambridge University Press:  30 July 2020

Adam Hitchcock ,
Hao Yuan ,
Lis Melo  and
Nabil Basim
Adam Hitchcock
Affiliation:
McMaster University, Hamilton, Ontario, Canada
Hao Yuan
Affiliation:
McMaster University, Hamilton, Ontario, Canada
Lis Melo
Affiliation:
McMaster University, Hamilton, Ontario, Canada
Nabil Basim
Affiliation:
McMaster University, Hamilton, Ontario, Canada

Abstract

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Type
Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2072 - 2074
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Copyright
Copyright © Microscopy Society of America 2020

References

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