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Simultaneous Atomic Force and Confocal Fluorescence Microscopy for Correlated Nanometer Topographical and Optical Resolution

  • O. Schulz (a1), A. Ward (a1), R. Ros (a1), Z. Zhao (a2), Y. Liu (a2) and H. Yan (a2)...


Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.



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