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Scanning Transmission Electron Microscopy: The Major Beneficiary of Aberration Correction?

Published online by Cambridge University Press:  26 July 2009

AL Bleloch ,
M Gass ,
B Mendis ,
K Sader ,
B Schaffer  and
P Wang
AL Bleloch
Affiliation:
SuperSTEM Laboratory
M Gass
Affiliation:
SuperSTEM Laboratory
B Mendis
Affiliation:
SuperSTEM Laboratory
K Sader
Affiliation:
SuperSTEM Laboratory
B Schaffer
Affiliation:
SuperSTEM Laboratory
P Wang
Affiliation:
SuperSTEM Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 152 - 153
Copyright
Copyright © Microscopy Society of America 2009