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Scanning Probe Microscopy Based Characterizations of III-V Semiconductor Quantum Well Devices

Published online by Cambridge University Press:  23 November 2012

M. Yakes ,
N. Mahadik ,
S.B. Qadri ,
E.H. Aifer ,
I. Vurgaftman ,
J.R. Meyer  and
A.R. Laracuente
M. Yakes
Affiliation:
Naval Research Laboratory, Washington, DC
N. Mahadik
Affiliation:
Naval Research Laboratory, Washington, DC
S.B. Qadri
Affiliation:
Naval Research Laboratory, Washington, DC
E.H. Aifer
Affiliation:
Naval Research Laboratory, Washington, DC
I. Vurgaftman
Affiliation:
Naval Research Laboratory, Washington, DC
J.R. Meyer
Affiliation:
Naval Research Laboratory, Washington, DC
A.R. Laracuente
Affiliation:
Naval Research Laboratory, Washington, DC
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1810 - 1811
Copyright
Copyright © Microscopy Society of America 2012

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