Hostname: page-component-8448b6f56d-42gr6 Total loading time: 0 Render date: 2024-04-23T08:04:24.120Z Has data issue: false hasContentIssue false
  • English
  • Français

Scanning Electron Microscopy and X-Ray Microanalysis 4th Edition, Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy, Springer, 2018, 550 pp. ISBN:978-1-4939-6674-5.

Published online by Cambridge University Press:  30 October 2018

Lucille A. Giannuzzi
Lucille A. Giannuzzi*
Affiliation:
L.A. Giannuzzi & Associates LLC, Fort Myers, FL 33913, USA EXpressLO LLC, Lehigh Acres, FL 33971,USA
Get access

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Book Review
Information
Microscopy and Microanalysis , Volume 24 , Issue 6 , December 2018 , pp. 768
Copyright
© Microscopy Society of America 2018 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

Cite this article: Giannuzzi LA (2018) Scanning Electron Microscopy and X-Ray Microanalysis. Microsc Microanal. 24(6), 768. doi: 10.1017/S1431927618015271

References

Cite this article: Giannuzzi LA (2018) Scanning Electron Microscopy and X-Ray Microanalysis. Microsc Microanal. 24(6), 768. doi: 10.1017/S1431927618015271