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Scanning Electron Microscopy and X-Ray Microanalysis 4th Edition, Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy, Springer, 2018, 550 pp. ISBN:978-1-4939-6674-5.

  • Lucille A. Giannuzzi (a1) (a2)

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Cite this article: Giannuzzi LA (2018) Scanning Electron Microscopy and X-Ray Microanalysis. Microsc Microanal. 24(6), 768. doi: 10.1017/S1431927618015271

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Cite this article: Giannuzzi LA (2018) Scanning Electron Microscopy and X-Ray Microanalysis. Microsc Microanal. 24(6), 768. doi: 10.1017/S1431927618015271

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