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Save your FIB from the hard work – Large-scale sample prep using a LaserFIB

Published online by Cambridge University Press:  30 July 2021

Tobias Volkenandt ,
Fabián Pérez Willard  and
Benjamin Tordoff
Tobias Volkenandt
Affiliation:
Carl Zeiss Microscopy GmbH, Germany
Fabián Pérez Willard
Affiliation:
Carl Zeiss Microscopy GmbH, Germany
Benjamin Tordoff
Affiliation:
Carl Zeiss Microscopy GmbH, Germany

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 18 - 19
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America