Hostname: page-component-8448b6f56d-qsmjn Total loading time: 0 Render date: 2024-04-16T23:53:14.777Z Has data issue: false hasContentIssue false

Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished Specimens

Published online by Cambridge University Press:  07 November 2016

Xiang Li Zhong
Affiliation:
School of Materials, Materials Performance Centre· and Electron Microscopy Centre, University of Manchester, Manchester M13 9PL, UK
Sibylle Schilling
Affiliation:
School of Materials, Materials Performance Centre· and Electron Microscopy Centre, University of Manchester, Manchester M13 9PL, UK
Nestor J. Zaluzec*
Affiliation:
School of Materials, Materials Performance Centre· and Electron Microscopy Centre, University of Manchester, Manchester M13 9PL, UK Argonne National Laboratory, Electron Microscopy Center, Center for Nanoscale Materials, Argonne, IL 60439, USA
M. Grace Burke
Affiliation:
School of Materials, Materials Performance Centre· and Electron Microscopy Centre, University of Manchester, Manchester M13 9PL, UK
*
*Corresponding author. zaluzec@microscopy.com
Get access

Abstract

In recent years, an increasing number of studies utilizing in situ liquid and/or gaseous cell scanning/transmission electron microscopy (S/TEM) have been reported. Because of the difficulty in the preparation of suitable specimens, these environmental S/TEM studies have been generally limited to studies of nanoscale structured materials such as nanoparticles, nanowires, or sputtered thin films. In this paper, we present two methodologies which have been developed to facilitate the preparation of electron-transparent samples from conventional bulk metals and alloys for in situ liquid/gaseous cell S/TEM experiments. These methods take advantage of combining sequential electrochemical jet polishing followed by focused ion beam extraction techniques to create large electron-transparent areas for site-specific observation. As an example, we illustrate the application of this methodology for the preparation of in situ specimens from a cold-rolled Type 304 austenitic stainless steel sample, which was subsequently examined in both 1 atm of air as well as fully immersed in a H2O environment in the S/TEM followed by hyperspectral imaging. These preparation techniques can be successfully applied as a general procedure for a wide range of metals and alloys, and are suitable for a variety of in situ analytical S/TEM studies in both aqueous and gaseous environments.

Type
Instrumentation and Software Techniques
Copyright
© Microscopy Society of America 2016 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Chee, S.W., Duquette, D.J., Ross, F.M. & Hull, R. (2014). Metastable structures in Al thin films before the onset of corrosion pitting as observed using liquid cell transmission electron microscopy. Microsc Microanal 20(2), 462468.CrossRefGoogle ScholarPubMed
Dalili, N., Li, P., Kupsta, M., Liu, Q. & Ivey, D.G. (2014). In situ TEM study of stability of TaRhx diffusion barriers using a novel sample preparation method. Micron 58, 2531.CrossRefGoogle ScholarPubMed
de Jonge, N., Peckys, D.B., Kremers, G.J. & Piston, D.W. (2009). Electron microscopy of whole cells in liquid with nanometre resolution. Proc Natl Acad Sci U S A 106(7), 21592164.Google Scholar
Dens Solutions B.V. (2016). Available at http://denssolutions.com (retrieved May 1, 2016).Google Scholar
Evans, J.E., Jungjohann, K.L., Browning, N.D. & Arslan, I. (2011). Controlled growth of nanoparticles from solution with in situ liquid transmission electron microscopy. Nano Lett 11(7), 28092813.CrossRefGoogle ScholarPubMed
Giannuzzi, L.A., Kempshall, B.W., Schwarz, S.M., Lomness, J.K., Prenitzer, B.I. & Stevie, F.A. (2005). FIB lift-out specimen preparation techniques. In Introduction to Focused Ion Beams, Giannuzzi, L.A. & Stevie, B.I. (Eds.), pp. 201228. New York, NY: Springer.Google Scholar
Giannuzzi, L.A. & Stevie, F.A. (1999). A review of focused ion beam milling techniques for TEM specimen preparation. Micron 30, 197204.CrossRefGoogle Scholar
Giannuzzi, L.A., Yu, Z., Yin, D., Harmer, M.P., Xu, Q., Smith, N.S., Chan, L., Hiller, J., Hess, D. & Clark, T. (2015). Theory and new applications of ex situ lift out. Microsc Microanal 21(4), 10341048.CrossRefGoogle ScholarPubMed
Holtz, M.E., Yu, Y., Gao, J., Abruña, H.D. & Muller, D.A. (2013). In situ electron energy-loss spectroscopy in liquids. Microsc Microanal 19, 10271035.Google Scholar
Huang, Z. (2004). Combining Ar ion milling with FIB lift-out technique for high quality site specific TEM samples. J Microsc 215, 219223.CrossRefGoogle ScholarPubMed
Hummingbird Scientific (2016). Available at http://hummingbirdscientific.com (retrieved May 1, 2016).Google Scholar
Kestel, B. (1986). Polishing methods for metallic and ceramic transmission electron microscopy specimens, ANL-80-120/Rev.1 report, NTIS DE89016686 Issue Number 199005. Available at https://ntrl.ntis.gov/NTRL/dashboard/searchResults.xhtml?searchQuery=ANL-80-120.Google Scholar
Mayer, J., Giannuzzi, L.A., Kamino, T. & Michae, J. (2007). TEM sample preparation and FIB-induced damage. MRS Bull 32, 400407.Google Scholar
Parent, L.R., Robinson, D.B., Cappillino, P.J., Hartnett, R.J., Abellan, P., Evans, J.E., Browning, N.D. & Arslan, I. (2014). In situ observation of directed nanoparticle aggregation during the synthesis of ordered nanoporous metal in soft templates. Chem Mater 26(3), 14261433.CrossRefGoogle Scholar
Parsons, D.F. (1974). Structure of wet specimens in electron microscopy: Improved environmental chambers make it possible to examine wet specimens easily. Science 186, 407414.CrossRefGoogle ScholarPubMed
Prestat, E., Smith, M., Jansen, A., Slater, T.J.A., Camargo, P.H.C., Kulzick, M.A., Burke, M.G., Haigh, S.J. & Zaluzec, N.J. (2015). XEDS and EELS in the TEM at atmospheric pressure and high temperature. Microsc Microanal 21(Suppl 3), 247248.CrossRefGoogle Scholar
Proetto, M.T., Rush, A.M., Chien, M.P., Abellan Baeza, P., Patterson, J.P., Thompson, M.P., Olson, N.H., Moore, C.E., Rheingold, A.L., Andolina, C., Millstone, J., Howell, S.B., Browning, N.D., Evans, J.E. & Gianneschi, N.C. (2014). Dynamics of soft nanomaterials captured by transmission electron microscopy in liquid water. J Am Chem Soc 136(4), 11621165.CrossRefGoogle ScholarPubMed
Protochips Inc (2016). Available at http://www.protochips.com (retrieved May 1, 2016).Google Scholar
Radisic, A., Ross, F.M. & Searson, P.C. (2006 a). In situ study of the growth kinetics of individual island electrodeposition of copper. J Phys Chem B 110, 78627868.Google Scholar
Radisic, A., Vereecken, P.M., Searson, P.C. & Ross, F.M. (2006 b). The morphology and nucleation kinetics of copper islands during electrodeposition. Surf Sci 600, 18171826.Google Scholar
Schilling, S., Janssen, A., Burke, M.G., Zhong, X.L., Haigh, S.J., Kulzick, M.A. & Zaluzec, N.J. (2014). In situ analytical electron microscopy: Imaging and analysis of steel in liquid water, IT-7-O-2947. 18th International Microscopy Congress, Prague, September 2014, pp. 7–112.Google Scholar
Schilling, S., Janssen, A., Zhong, X.L., Zaluzec, N.J. & Burke, M.G. (2015). Liquid in situ analytical electron microscopy: examining SCC precursor events for type 304 stainless steel in H2O. Microscopy Microanalysis 21(S3), 12911292.Google Scholar
Unocic, K.A., Allard, L.F., Coffey, D.W., More, K.L. & Unocic, R.R. (2014). Novel method for precision controlled heating of TEM thin sections to study reaction processes. Microsc Microanal 20(Suppl 3), 16281629.CrossRefGoogle Scholar
Unocic, R., Adamczyk, L.A., Dudney, N.J., Alsem, D., Salmon, N.J. & More, K.L. (2011). In-situ TEM characterization of electrochemical processes in energy storage systems. Microsc Microanal 7(Suppl 2), 2011.Google Scholar
Williamson, M.J., Tromp, R.M., Vereecken, P.M., Hull, R. & Ross, F.M. (2003). Dynamic microscopy of nanoscale cluster growth at the solid-liquid interface. Nat Mater 2(8), 532536.Google Scholar
Young, R.J., Buxbaum, A. & Peterson, B. (2008). Applications of in-situ sample preparation and modeling of SEM-STEM imaging. Proceedings of the 34th International Symposium for Testing and Failure Analysis, October 31, 2008, Portland, OR, pp. 320–326.CrossRefGoogle Scholar
Yuk, J.M., Park, J., Ercius, P., Kim, K., Hellebusch, J., Crommie, M.F., Lee, J.Y., Zettl, A. & Alivisatos, A.P. (2012). High-resolution EM of colloidal nanocrystal growth using graphene liquid cells. Science 335(6077), 6164.Google Scholar
Zaluzec, N.J., Burke, M.G., Haigh, S.J. & Kulzick, M.A. (2014 a). X-ray energy-dispersive spectrometry during in situ liquid cell studies using an analytical electron microscope. Microsc Microanal 20, 323329.CrossRefGoogle ScholarPubMed
Zaluzec, N.J., Demortiere, A., Cook, R.E., Koritalia, R.E., Wen, J.G., Miller, D.J. & Kulzick, M.A. (2014 b). X-ray and electron energy loss spectroscopy in liquids in the analytical S/TEM. Microsc Microanal 20(Suppl 3), 15181591.Google Scholar
Zheng, M., Claridge, S.A., Minor, A.M., Alivisatos, A.P. & Dahmen, U. (2009). Nanocrystal diffusion in a liquid thin film observed by in situ transmission electron microscopy. Nano Lett 9, 24602465.Google Scholar
Zhong, X.L., Burke, M.G., Schilling, S., Haigh, S.J., Kulzick, M.A. & Zaluzec, N.J. (2014). Novel hybrid sample preparation method for in situ liquid cell TEM analysis. Microsc Microanal 20(Suppl 3), 15141515.Google Scholar
Ziemniak, S.E. & Hanson, M. (2002). Corrosion behavior of 304 stainless steel in high temperature, hydrogenated water. Corros Sci 44(10), 22092230.Google Scholar