Hostname: page-component-7bb8b95d7b-cx56b Total loading time: 0 Render date: 2024-09-27T22:14:16.666Z Has data issue: false hasContentIssue false
  • English
  • Français

Reproducibility in Focused Ion Beam sample preparation - a Key Requirement for Cryo-Electron Tomography of Eukaryotic Cells

Published online by Cambridge University Press:  09 October 2013

M. Schaffer ,
E. Villa ,
B. Engel ,
Y. Fukuda ,
T. Laugks ,
A. Rigort ,
M. Schüler ,
A. Schwarz ,
F. Bäuerlein  and
J. Mahami
...Show all authors
M. Schaffer
Affiliation:
E. Villa
Affiliation:
B. Engel
Affiliation:
Y. Fukuda
Affiliation:
T. Laugks
Affiliation:
A. Rigort
Affiliation:
M. Schüler
Affiliation:
A. Schwarz
Affiliation:
F. Bäuerlein
Affiliation:
J. Mahami
Affiliation:
W. Baumeister
Affiliation:
J.M. Plitzko
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 876 - 877
Copyright
Copyright © Microscopy Society of America 2013