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Recent Developments of ζ-factor Microanalysis and Its Application to Armor Ceramics

Published online by Cambridge University Press:  30 July 2020

Christopher Marvel
Affiliation:
Lehigh University, Bethlehem, Pennsylvania, United States
Kristopher Behler
Affiliation:
SURVICE Engineering; CCDC Army Research Laboratory, Aberdeen Proving Ground, Maryland, United States
Vladislav Domnich
Affiliation:
Rutgers University; Ferro Corporation, King of Prussia, Pennsylvania, United States
Jerry LaSalvia
Affiliation:
CCDC Army Research Laboratory, Aberdeen Proving Ground, Maryland, United States
Richard Haber
Affiliation:
Rutgers University, Piscataway, New Jersey, United States
Masashi Watanabe
Affiliation:
Lehigh University, Bethlehem, Pennsylvania, United States
Martin Harmer
Affiliation:
Lehigh University, Bethlehem, Pennsylvania, United States
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Abstract

Image of the first page of this article
Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Copyright
Copyright © Microscopy Society of America 2020

References

Marvel, C.J., Behler, K. D., LaSalvia, J. C., Domnich, V., Haber, R. A., Watanabe, M., and Harmer, M. P.. “Extending ζ-factor microanalysis to boron-rich ceramics: Quantification of bulk stoichiometry and grain boundary composition.” Ultramicroscopy 202 (2019): 163172.10.1016/j.ultramic.2019.04.008CrossRefGoogle ScholarPubMed
Domnich, V., Reynaud, S., Haber, R.A., Chhowalla, M.. “Boron carbide: structure, properties, and stability under stress.” Journal of the American Ceramic Society 94, no. 11 (2011): 36053628.10.1111/j.1551-2916.2011.04865.xCrossRefGoogle Scholar
LaSalvia, J.C., Campbell, J., Swab, J. J., and McCauley, J. W.. “Beyond hardness: ceramics and ceramic-based composites for protection.” Jom 62, no. 1 (2010): 1623.10.1007/s11837-010-0004-zCrossRefGoogle Scholar
Behler, K.D., Marvel, C.J., LaSalvia, J.C., Walck, S.D., and Harmer, M.P.. “Observations of grain boundary chemistry variations in a boron carbide processed with oxide additives.” Scripta Materialia 142 (2018): 106110.10.1016/j.scriptamat.2017.08.033CrossRefGoogle Scholar
Watanabe, M. and Williams, D. B.. “The quantitative analysis of thin specimens: a review of progress from the Cliff-Lorimer to the new ζ-factor methods.” Journal of microscopy 221, no. 2 (2006): 89109.10.1111/j.1365-2818.2006.01549.xCrossRefGoogle ScholarPubMed
Alber, U., Müllejans, H., and Rühle, M.. “Improved quantification of grain boundary segregation by EDS in a dedicated STEM.Ultramicroscopy 69, no. 2 (1997): 105116.10.1016/S0304-3991(97)00036-3CrossRefGoogle Scholar
Keast, V.J. and Williams, D. B.. “Quantification of boundary segregation in the analytical electron microscope.” Journal of microscopy 199, no. 1 (2000): 4555.10.1046/j.1365-2818.2000.00694.xCrossRefGoogle ScholarPubMed
Krause, A.R., Cantwell, P.R., Marvel, C.J., Compson, C., Rickman, J.M., and Harmer, M.P.. “Review of grain boundary complexion engineering: Know your boundaries.” Journal of the American Ceramic Society 102, no. 2 (2019): 778800.Google Scholar
Gibbs, J.W.. The collected works of J. Willard Gibbs. No. 536.7092. Yale Univ. Press, 1948.Google Scholar

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