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Recent Advances in the Analysis of Nitrogen by EPMA
Published online by Cambridge University Press: 05 August 2019
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- Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
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- Copyright © Microscopy Society of America 2019
References
[3]Dalou, C, Hirschmann, M, v.d.Handt, A, Mosenfelder, J, and Armstrong, L, EPSL 458 (2017), pp. 141.Google Scholar
[5]Terauchi, M., In: TEM Characterization of Nanomaterials (Springer: Berlin, Heidelberg), p.287-331.Google Scholar
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