Hostname: page-component-848d4c4894-nmvwc Total loading time: 0 Render date: 2024-07-03T16:10:30.433Z Has data issue: false hasContentIssue false

Quantitative X-ray Microanalysis of Low Atomic Number Elements by SEM/SDD-EDS with NIST DTSA II: Carbides and Nitrides and Oxides, Oh My!

Published online by Cambridge University Press:  27 August 2014

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Goldstein, J., et al., Scanning Electron Microscopy and X-ray Microanalysis, 3rd ed. (Springer, New York (2003) 391.Google Scholar
[2] Bastin, G.and Heijligers, H. in Electron Probe Quantitation, K Heinrich and D. Newbury, eds. (Plenum, New York (1991)163-175.Google Scholar
[3] Ritchie, N., Newbury, D., and Davis, J.Microsc. Microanal., 182012) 892.Google Scholar