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Quantitative non-destructive 3D Crystallographic Imaging of Microstructures using Laboratory X-ray Diffraction Contrast Tomography

Published online by Cambridge University Press:  10 August 2018

Hrishikesh Bale ,
Ron Kienan ,
Stephen T Kelly ,
Nicolas Gueninchault ,
Erik Lauridsen  and
Ashwin Shahani
Hrishikesh Bale*
Affiliation:
Carl Zeiss Microscopy, Pleasanton, CA, USA.
Ron Kienan
Affiliation:
Dept. of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA
Stephen T Kelly
Affiliation:
Carl Zeiss Microscopy, Pleasanton, CA, USA.
Nicolas Gueninchault
Affiliation:
Xnovo Technology ApS, K0ge, Denmark
Erik Lauridsen
Affiliation:
Xnovo Technology ApS, K0ge, Denmark
Ashwin Shahani
Affiliation:
Dept. of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA
*
*Corresponding author, hrishikesh.bale@zeiss.com

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 554 - 555
Copyright
© Microscopy Society of America 2018 

References

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