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Quantitative HAADF-studies of GaP/Si-interfaces

  • B. Haas (a1), A. Beyer (a1), J. Ohlmann (a1), W. Stolz (a1) and K. Volz (a1)...

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Quantitative HAADF-studies of GaP/Si-interfaces

  • B. Haas (a1), A. Beyer (a1), J. Ohlmann (a1), W. Stolz (a1) and K. Volz (a1)...

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