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Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis

Published online by Cambridge University Press:  05 August 2019

Ari N. Blumer ,
Jacob T. Boyer ,
Julia I. Deitz ,
Francisco A. Rodriguez  and
Tyler J. Grassman
Ari N. Blumer
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA.
Jacob T. Boyer
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA.
Julia I. Deitz
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA.
Francisco A. Rodriguez
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA.
Tyler J. Grassman*
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, USA. Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, USA.
*
*Corresponding author: grassman.5@osu.edu

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 202 - 203
Copyright
Copyright © Microscopy Society of America 2019 

References

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