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Quantitative Assessment of Lower-Voltage TEM Performance Using 3D Fourier Transform of Through-Focus Series
Published online by Cambridge University Press: 27 August 2014
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- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 936 - 937
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- Copyright © Microscopy Society of America 2014
References
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O’Keefe, M. A., Allard, L. F., Bolm, D. A. Microsc. Microanal. 15 (2009) 1470-1471.Google Scholar
[12] We thank Drs. Nagai, Lazar, Freitag, Sawada, Sasaki, Ohwada, Sato and Suenaga for invaluable discussions. This work is partly supported by Nanotechnology Platform Project of MEXT Japan, and Research Acceleration Program of JSPS.Google Scholar
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