Hostname: page-component-7bb8b95d7b-dtkg6 Total loading time: 0 Render date: 2024-09-25T02:23:12.518Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantifying polarization fields and sheet charge in III-nitride HEMT devices using off-axis electron holography

Published online by Cambridge University Press:  23 November 2012

M.R. Johnson ,
D.J. Smith ,
L. Zhou ,
M.R. McCartney  and
D.A. Cullen
M.R. Johnson
Affiliation:
Physics, Arizona State University, Tempe, AZ
D.J. Smith
Affiliation:
Physics, Arizona State University, Tempe, AZ
L. Zhou
Affiliation:
Physics, Arizona State University, Tempe, AZ
M.R. McCartney
Affiliation:
Physics, Arizona State University, Tempe, AZ
D.A. Cullen
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1832 - 1833
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)