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Quantification of Thermal Interface Resistance Using Atomic Scale Debye-Waller Thermometry

Published online by Cambridge University Press:  30 July 2020

Menglin Zhu  and
Jinwoo Hwang
Menglin Zhu
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio, United States
Jinwoo Hwang
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 960 - 962
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Copyright
Copyright © Microscopy Society of America 2020

References

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