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Prospects for Three-Dimensional, Sub-Nanometer Imaging with Aberration-Corrected ADF-STEM

Published online by Cambridge University Press:  05 August 2007

DA Muller ,
V Intaraprasonk ,
H Xin  and
P Ercius
DA Muller
Affiliation:
Cornell University
V Intaraprasonk
Affiliation:
Cornell University
H Xin
Affiliation:
Cornell University
P Ercius
Affiliation:
Cornell University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 86 - 87
Copyright
© 2007 Microscopy Society of America

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