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Probing Nanoparticle Magnetism by Aberration Corrected STEM-EELS

Published online by Cambridge University Press:  23 November 2012

S. Pennycook ,
M. Varela ,
J. Gazquez ,
J. Salafranca ,
N. Perez ,
A. Labarta ,
X. Batlle  and
S. Pantelides
S. Pennycook
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
M. Varela
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
J. Gazquez
Affiliation:
Universidad Complutense, Madrid, Spain
J. Salafranca
Affiliation:
Universidad Complutense, Madrid, Spain
N. Perez
Affiliation:
Universidad de Barcelona, Barcelona, Spain
A. Labarta
Affiliation:
Universidad de Barcelona, Barcelona, Spain
X. Batlle
Affiliation:
Universidad de Barcelona, Barcelona, Spain
S. Pantelides
Affiliation:
Vanderbilt University, Nashville, TN
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1362 - 1363
Copyright
Copyright © Microscopy Society of America 2012

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