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Probe Shaping for Quantitative DPC-STEM Using Segmented Detectors

Published online by Cambridge University Press:  01 August 2018

L. Clark ,
H.G. Brown ,
D.M. Paganin ,
M.J. Morgan ,
T. Matsumoto ,
N. Shibata ,
T.C. Petersen  and
S.D. Findlay
L. Clark
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
H.G. Brown
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
D.M. Paganin
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
M.J. Morgan
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
T. Matsumoto
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
N. Shibata
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
T.C. Petersen
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
S.D. Findlay
Affiliation:
School of Physics and Astronomy, Monash University, Victoria, Australia
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Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 916 - 917
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© Microscopy Society of America 2018 

References

[1] McMullan, G, et al, Ultramicroscopy 109 2009) p 1126.CrossRefGoogle Scholar
[2] Tate, MW, et al, Microscopy and Microanalysis 22 2016) p 237.CrossRefGoogle Scholar
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[4] Ophus, C, et al, Nature Communications 7 2016) p 10719.CrossRefGoogle Scholar
[5] Clark, L, et al arXiv:1801.07572 2018.Google Scholar
[6] Verbeeck, J, Tian, H Schattschneider, P 467 2010) p 301.Google Scholar
[7] Clark, L, et al, Physical Review Letters 111 2013 064801.CrossRefGoogle Scholar
[8] Shiloh, R, et al, Ultramicroscopy 144 2014) p 26.CrossRefGoogle Scholar
[9] McMorran, BJ, et al, FEMMS conference 2017) p 25.Google Scholar
[10] This research was supported by the Australian Research Council Discovery Projects funding scheme (Project DP160102338). N.S. acknowledges support from SENTAN, JST and JSPS KAKENHI Grant numbers JP26289234 and JP17H01316. The GaAs p-n junction samples were provided by Hirokazu Sasaki, Furukawa Electric Co., Ltd.Google Scholar

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