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Principles and Applications of Energy-Filtered Scanning CBED for Ferroelectric Domain Imaging and Symmetry Determination

Published online by Cambridge University Press:  23 September 2015

Yu-Tsun Shao
Affiliation:
Department of Materials Science and Engineering, University of Illinois, Urbana, Illinois 61801, USA
Kyou-Hyun Kim
Affiliation:
Advanced Process and Materials R&BD Group, Korea Institute of Industrial Technology, Incheon, 406-840, Korea
Jian-Min Zuo
Affiliation:
Department of Materials Science and Engineering, University of Illinois, Urbana, Illinois 61801, USA Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801, USA
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Abstract

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Copyright © Microscopy Society of America 2015 

References

[1] Kim, K., Payne, D. A. & Zuo, J. M., Phys. Rev. B 86 (2012) 184113.CrossRefGoogle Scholar
[2] Kim, K. & Zuo, J. M., Ultramicroscopy 124 (2013) 71.CrossRefGoogle Scholar
[3] Park, S. E. & Shrout, T. R., J. Appl. Phys. 82 (1997) 1804.CrossRefGoogle Scholar
[4] This work is supported by U.S. Department of Energy, Office of Basic Energy Sciences under contract DEFG02-01ER45923..Google Scholar
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