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A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM

Published online by Cambridge University Press:  04 January 2008

Jun Yamasaki ,
Tomoyuki Kawai ,
Yushi Kondo  and
Nobuo Tanaka
Jun Yamasaki
Affiliation:
EcoTopia Science Institute, Nagoya University, Nagoya 464-8603, Japan
Tomoyuki Kawai
Affiliation:
Department of Crystalline Materials Science, Nagoya University, Nagoya 464-8603, Japan
Yushi Kondo
Affiliation:
Department of Crystalline Materials Science, Nagoya University, Nagoya 464-8603, Japan
Nobuo Tanaka
Affiliation:
EcoTopia Science Institute, Nagoya University, Nagoya 464-8603, Japan
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Abstract

We propose a simple and practical solution to remove artificial contrast inhibiting direct interpretation of atomic arrangements in aberration-corrected TEM. The method is based on a combination of “image subtraction” for elimination of nonlinear components in images and newly improved “image deconvolution” for proper compensation of nonflat phase contrast transfer function. The efficiency of the method is shown by experimental and simulation data of typical materials such as gold, silicon, and magnesium oxide. The hypothetical results from further improvements of TEM instruments are also simulated. It is concluded that we can approach actual atomic structures by using the present method, that is, a proper combination of a Cs corrector, image subtraction, and image deconvolution processes.

Keywords

aberration-corrected TEMnonlinear componentimage subtractionimage deconvolutionartificial image contrastCs-corrected TEM
Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Issue 1: Special Issue: Materials Research in an Aberration-Free Environment , February 2008 , pp. 27 - 35
Copyright
© 2008 Microscopy Society of America

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References

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