Practical Measurement of X-ray Detection Performance of a Large Solid-Angle Silicon Drift Detector in an Aberration-Corrected STEM

M. Watanabe; C. Wade

doi:10.1017/S1431927613008313

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Crossref Citations

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Zaluzec, Nestor J. 2014. Analytical Formulae for Calculation of X-Ray Detector Solid Angles in the Scanning and Scanning/Transmission Analytical Electron Microscope. Microscopy and Microanalysis, Vol. 20, Issue. 4, p. 1318.

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Zaluzec, Nestor 2021. First Light on the Argonne PicoProbe and The X-ray Perimeter Array Detector (XPAD). Microscopy and Microanalysis, Vol. 27, Issue. S1, p. 2070.

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Nilsen, Julie Stene and van Helvoort, Antonius T. J. 2022. Composition Analysis by STEM-EDX of Ternary Semiconductors by Internal References. Microscopy and Microanalysis, Vol. 28, Issue. 1, p. 61.

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Zaluzec, Nestor J 2023. X-ray Spectrometry in the Era of Aberration-Corrected Electron Optical Beam Lines. Microscopy and Microanalysis, Vol. 29, Issue. 1, p. 334.

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Practical Measurement of X-ray Detection Performance of a Large Solid-Angle Silicon Drift Detector in an Aberration-Corrected STEM

Abstract

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